DocumentCode :
2830584
Title :
Pitfalls in crystallographic analysis of doped skutterudite materials
Author :
Bertini, L. ; Billquist, K. ; Christensen, M. ; Gatti, C. ; Holmgren, L. ; Iversen, B. ; Mueller, E. ; Muhammed, M. ; Noriega, G. ; Palmqvist, A. ; Platzek, D. ; Rowe, D.M. ; Saramat, A. ; Stiewe, C. ; Toprak, M. ; Williams, S.G. ; Zhang, Y.
Author_Institution :
Ist. di Sci. e Tecnologie Molecolari, Milano, Italy
fYear :
2003
fDate :
17-21 Aug. 2003
Firstpage :
68
Lastpage :
71
Abstract :
In this paper the versatility and pitfalls of powder diffraction are exemplified by a combined. conventional, synchrotron and neutron powder diffraction study of Ni doped skutterudites (Co(l-x)NixSb3).
Keywords :
X-ray diffraction; cobalt compounds; crystal structure; neutron diffraction; nickel compounds; thermoelectricity; Co(l-x)NixSb3; crystallographic analysis; doped skutterudite materials; Aerospace materials; Chemistry; Conducting materials; Crystalline materials; Crystallography; Impurities; Powders; Thermoelectricity; X-ray diffraction; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN :
0-7803-8301-X
Type :
conf
DOI :
10.1109/ICT.2003.1287451
Filename :
1287451
Link To Document :
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