DocumentCode
2830611
Title
Thermoelectric properties and electronic structure of Sn-doped CoSb3
Author
Tobola, J. ; Wojciechowski, K. ; Cieslak, J. ; Leszczynski, J.
Author_Institution
Fac. of Phys. & Nucl. Techniques, AGH Univ. of Sci. & Technol., Kracow, Poland
fYear
2003
fDate
17-21 Aug. 2003
Firstpage
76
Lastpage
80
Abstract
Electron transport properties of Sn-doped CoSb3 skutterudites were studied by electrical resistivity, thermopower, Hall effect and thermal conductivity measurements. The crystal structure of powder samples was analyzed by the Rietveld refinements of X-ray diffraction data. 119Sn Mossbauer technique was used for investigations of Sn atom distributions. It was shown that the obtained spectra could be fitted by two sets of hyperfine parameters related to different Sn positions. Electronic structure of both ordered compounds (Co4Sb12, Co4Sb11Sn and SnCo4Sb12) and disordered alloys (Co4Sb12-xSnx and SnyCo4Sb12) were calculated by the charge self-consistent KKR-CPA methods. This approach allowed determining density of states (DOS) of impurities placed in the semiconducting CoSb3.
Keywords
CPA calculations; Hall effect; KKR calculations; Mossbauer effect; SCF calculations; Seebeck effect; X-ray diffraction; band structure; carrier density; cobalt compounds; thermal conductivity; thermoelectric power; tin compounds; 119Sn Mossbauer technique; Co4Sb11Sn; Co4Sb12-xSnx; Co4Sb12; Hall effect; Rietveld refinements; Sn-doped CoSb3; SnyCo4Sb12; SnCo4Sb12; X-ray diffraction; charge self-consistent KKR-CPA methods; crystal structure; density of states; electrical resistivity; electronic structure; hyperfine parameters; skutterudites; thermal conductivity; thermoelectric properties; thermopower; Conductivity measurement; Electric resistance; Electrons; Hall effect; Powders; Thermal conductivity; Thermal resistance; Thermoelectricity; Tin; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN
0-7803-8301-X
Type
conf
DOI
10.1109/ICT.2003.1287453
Filename
1287453
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