Title :
Robust spot fitting for genetic spot array images
Author :
Chen, H-Z ; Brändle, N. ; Bischof, H. ; Lapp, H.
Author_Institution :
Pattern Recognition & Image Process. Group, Vienna Univ. of Technol., Vienna, Austria
Abstract :
Addresses the problem of reliably fitting parametric and semi-parametric models to high density spot array images obtained in gene expression experiments. The goal is to measure the amount of genetic material at specific spot locations. Many spots can be modelled accurately by a Gaussian shape. In order to deal with highly overlapping spots the authors use robust M-estimators. When the parametric method fails, they use a novel, robust semi-parametric method which can handle spots of different shapes accurately. They present the results for real data and compare the complexity of the two methods
Keywords :
biological techniques; biology computing; genetics; image processing; Gaussian shape; genetic spot array images; highly overlapping spots; methods complexity; robust M-estimators; robust spot fitting; Gene expression; Genetics; Image analysis; Image processing; Lapping; Noise shaping; Pattern recognition; Robustness; Safety; Shape;
Conference_Titel :
Image Processing, 2000. Proceedings. 2000 International Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-6297-7
DOI :
10.1109/ICIP.2000.899421