• DocumentCode
    2830890
  • Title

    Robust spot fitting for genetic spot array images

  • Author

    Chen, H-Z ; Brändle, N. ; Bischof, H. ; Lapp, H.

  • Author_Institution
    Pattern Recognition & Image Process. Group, Vienna Univ. of Technol., Vienna, Austria
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    412
  • Abstract
    Addresses the problem of reliably fitting parametric and semi-parametric models to high density spot array images obtained in gene expression experiments. The goal is to measure the amount of genetic material at specific spot locations. Many spots can be modelled accurately by a Gaussian shape. In order to deal with highly overlapping spots the authors use robust M-estimators. When the parametric method fails, they use a novel, robust semi-parametric method which can handle spots of different shapes accurately. They present the results for real data and compare the complexity of the two methods
  • Keywords
    biological techniques; biology computing; genetics; image processing; Gaussian shape; genetic spot array images; highly overlapping spots; methods complexity; robust M-estimators; robust spot fitting; Gene expression; Genetics; Image analysis; Image processing; Lapping; Noise shaping; Pattern recognition; Robustness; Safety; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2000. Proceedings. 2000 International Conference on
  • Conference_Location
    Vancouver, BC
  • ISSN
    1522-4880
  • Print_ISBN
    0-7803-6297-7
  • Type

    conf

  • DOI
    10.1109/ICIP.2000.899421
  • Filename
    899421