Title :
Single crystal growth of homologous compounds in the ZnO-In2O3 system and thermoelectric properties
Author :
Malochkin, Oleg ; Seo, Won-Seon ; Koumoto, Kunihito
Author_Institution :
Dept. of Appl. Chem., Nagoya Univ., Japan
Abstract :
Single crystals of (ZnO)5In2O3 were grown by a normal flux method, using PbF2 as a flux, and the resulting flaky single crystals were very thin along the c-axis. Single crystal quality was evaluated by XRD, TEM, and SEM. Band gap energy of single crystal was optically determined. The inplane electrical conductivity (σ), and Seebeck coefficient (cc) were measured in the temperature range of 300 K to 1200 K and 500 K to 1200 K in air, respectively. The electrical conductivity of a single crystal was found to be 2×106 Sm-1 at room temperature, it decreased with increasing temperature and attained a value of 5×105 Sm-1 at 1200 K. Anisotropy of two orders of magnitude in electrical conductivity was first clarified. Seebeck coefficient was determined to be -9.6 μVK-1 at 500 K and -31.6 μVK-1 at 1200 K. The estimated power factor was about 1.4×10-4 Wm-1K-2 at 500 K. This factor increased with temperature, and reached the value of 5.3×10-4 Wm-1K-2 at 1200 K.
Keywords :
Seebeck effect; X-ray diffraction; crystal growth from solution; energy gap; indium compounds; scanning electron microscopy; semiconductor growth; thermoelectricity; transmission electron microscopy; zinc compounds; (ZnO)5In2O3; 300 to 1200 K; 500 to 1200 K; SEM; Seebeck coefficient; TEM; XRD; ZnO-In2O3; ZnO-In2O3 system; band gap energy; homologous compounds; inplane electrical conductivity; normal flux method; single crystal growth; thermoelectric properties; Anisotropic magnetoresistance; Conductivity measurement; Crystals; Electric variables measurement; Photonic band gap; Reactive power; Temperature distribution; Temperature measurement; X-ray scattering; Zinc oxide;
Conference_Titel :
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN :
0-7803-8301-X
DOI :
10.1109/ICT.2003.1287475