• DocumentCode
    2831170
  • Title

    Novel Multi-bit Watermarking Using Adaptive Embedding Algorithms with Minimum Error

  • Author

    Chen, Rong-Jian ; Lai, Jui-Lin ; Horng, Shi-Jinn

  • Author_Institution
    Dept. of Electron. Eng., Nat. United Univ., Miaoli, Taiwan
  • fYear
    2011
  • fDate
    June 30 2011-July 2 2011
  • Firstpage
    211
  • Lastpage
    218
  • Abstract
    This paper presents the novel multi-bit watermarking using adaptive embedding algorithms with minimum error. These embedding algorithms can embed multi-bit (k-bit, k≥1 ) logo data into cover data only introduce minimum embedding errors which are restricted to ±(2k-1-1)2i-k according to the embedding location i. To achieve the goal of minimum embedding error, we introduced the adaptive embedding algorithms to adaptively evaluate the most similar value to replace the original one and which can be divided into three steps: (1) embed logo data into cover data, (2) adaptively adjust the least-significant bits (LSBs) of cover data, and (3) adaptively adjust the maximum-significant bits (MSBs) of cover data. Thus, we called them as adaptive 3-step embedding algorithms. The proposed embedding algorithms are not only achieving minimum error but also suitable to hardware implementation due to they are bit wise and based on logic, arithmetic and bit operations. Many simulations show that the proposed adaptive 3-step embedding algorithms perform good embedding quality for watermarking applications.
  • Keywords
    watermarking; adaptive embedding algorithms; cover data; embedding algorithms; least significant bits; logo data; maximum significant bits; minimum error; multibit watermarking; Adaptation models; Discrete wavelet transforms; Frequency domain analysis; Image color analysis; Robustness; Software algorithms; Watermarking; minimum-error embedding; robustness; watermarking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Complex, Intelligent and Software Intensive Systems (CISIS), 2011 International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-61284-709-2
  • Electronic_ISBN
    978-0-7695-4373-4
  • Type

    conf

  • DOI
    10.1109/CISIS.2011.39
  • Filename
    5989049