• DocumentCode
    2831217
  • Title

    Device-process simulation of discrete silicon stabilitron with the stabilizing voltage of 6,5 V

  • Author

    Dudar, N.L. ; Borzdov, V.M.

  • Author_Institution
    Openly Join-Stock Co. Integral, Minsk, Belarus
  • fYear
    2011
  • fDate
    9-12 Sept. 2011
  • Firstpage
    237
  • Lastpage
    239
  • Abstract
    The technology was proposed for fabrication of the silicon stabilitron with the stabilizing voltage of 6,5 V. There were defined substrate resistivity, phosphorus diffusion into substrate mode, ensuring the required stabilization voltage values under the conditions of room and two marginal values of temperatures (-55°C, +150°C). Comparison was made of the simulation data with the experiment results.
  • Keywords
    substrates; device-process simulation; discrete silicon stabilitron; phosphorus diffusion; stabilization voltage; stabilizing voltage; substrate mode; substrate resistivity; temperature -55 C; temperature 150 C; Conductivity; Doping; Impurities; Schedules; Silicon; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (EWDTS), 2011 9th East-West
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4577-1957-8
  • Type

    conf

  • DOI
    10.1109/EWDTS.2011.6116417
  • Filename
    6116417