DocumentCode
283199
Title
ASICS. Can your designs be tested?
Author
Boyce, A.H.
Author_Institution
MSDS Res. Lab., Marconi Res. Centre, Chelmsford, UK
fYear
1988
fDate
32252
Firstpage
42461
Lastpage
42463
Abstract
With the combination of surface-mount inter-connection technology and the ever increasing integrated circuit complexity of ASICs the problems of testing VLSI devices and PCBs must not be ignored. It has been said that 90% of the cost of digital devices could be due to testing. With a reduction of testing costs one will have a great advantages over the other manufacturers. There is no easy answer but it is always possible to design untestable circuits. A designer has to appreciate that he is responsible for the testing costs as well as the design costs. When a design is produced that can readily be tested then there is a much better chance that this product will be reliable and therefore easier to manufacture
Keywords
VLSI; digital integrated circuits; integrated circuit testing; ASICS; PCBs; VLSI; digital devices; integrated circuit complexity; surface-mount inter-connection technology; testing; testing costs; untestable circuits;
fLanguage
English
Publisher
iet
Conference_Titel
Managing ASIC Design Projects, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
209099
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