• DocumentCode
    283199
  • Title

    ASICS. Can your designs be tested?

  • Author

    Boyce, A.H.

  • Author_Institution
    MSDS Res. Lab., Marconi Res. Centre, Chelmsford, UK
  • fYear
    1988
  • fDate
    32252
  • Firstpage
    42461
  • Lastpage
    42463
  • Abstract
    With the combination of surface-mount inter-connection technology and the ever increasing integrated circuit complexity of ASICs the problems of testing VLSI devices and PCBs must not be ignored. It has been said that 90% of the cost of digital devices could be due to testing. With a reduction of testing costs one will have a great advantages over the other manufacturers. There is no easy answer but it is always possible to design untestable circuits. A designer has to appreciate that he is responsible for the testing costs as well as the design costs. When a design is produced that can readily be tested then there is a much better chance that this product will be reliable and therefore easier to manufacture
  • Keywords
    VLSI; digital integrated circuits; integrated circuit testing; ASICS; PCBs; VLSI; digital devices; integrated circuit complexity; surface-mount inter-connection technology; testing; testing costs; untestable circuits;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Managing ASIC Design Projects, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    209099