DocumentCode
2832084
Title
Life tests of a skutterudites thermoelectric unicouple (MAR-03)
Author
Ei-Genk, M.S. ; Saber, Hamed H. ; Sakamoto, Jeff ; Caillat, Thierry
Author_Institution
Dept. of Chem. & Nucl. Eng., New Mexico Univ., Albuquerque, NM, USA
fYear
2003
fDate
17-21 Aug. 2003
Firstpage
417
Lastpage
420
Abstract
Life tests of a skutterudites unicouple (MAR-03) comprised of CeFe3.5Co0.5Sb12 P-leg and CoSb3 N-leg are performed. The tests, which are performed in argon at 0.051-0.068 MPa to suppress the antimony (Sb) sublimation from the N- and P-legs near the hot shoe, lasted for 450 hours, of which 261 hours at constant hot and cold junction temperatures of 973 K and 300 K, respectively. The open-circuit voltage, Voc (or Seebeck coefficient), and peak electric power, Pe,peak, decreased linearly from 203.6 mV and 671 mWe to 183.9 mV and 502 mWe, respectively, in 261 hours of cumulative testing. While the peak efficiency, ηpeak based on the measured voltage-current (V-I) characteristics and assuming zero side heat losses also decreased linearly from 10.3% after 24 hrs to 9.35% after 259 hrs of commutative testing. The estimated actual efficiency is lower, 7.32% and 3.83%, respectively, due to side heat losses. Ongoing tests confirmed present results and showed that the decrease in Seebeck coefficient of P-Leg levels off after 460-500 hours of testing, while that of the N-leg experiences little change. Post-tests examination showed only minimal losses of Sb from the N- and P-legs.
Keywords
Seebeck effect; cerium compounds; cobalt compounds; contact resistance; iron compounds; thermocouples; thermoelectric conversion; thermoelectricity; 183.9 mV; 203.6 mV; 261 h; 300 K; 450 h; 973 K; CeFe3.5Co0.5Sb12; CoSb3; Seebeck coefficient; commutative testing; estimated actual efficiency; life tests; peak efficiency; peak electric power; skutterudites thermoelectric unicouple; Argon; Circuit testing; Footwear; Life testing; Performance evaluation; Propulsion; Space technology; Tellurium; Temperature; Thermoelectricity;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN
0-7803-8301-X
Type
conf
DOI
10.1109/ICT.2003.1287537
Filename
1287537
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