DocumentCode
2832111
Title
Contact effects on silicon surface flashover studies
Author
Feuerstain, R. ; Senitzky, Benjamin
Author_Institution
Polytechnic University, Weber Research Institute
fYear
1989
fDate
1989
Firstpage
358
Lastpage
361
Keywords
Anodes; Current density; Dielectric constant; Electric breakdown; Electrons; Flashover; Optical switches; Silicon devices; Surface resistance; Vacuum breakdown;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1989. 7th
Type
conf
DOI
10.1109/PPC.1989.767497
Filename
767497
Link To Document