Title :
Dose rate and total dose noise performance of a commercial off the shelf dielectrically isolated JFET operational amplifier during irradiation
Author :
Hiemstra, David M.
Author_Institution :
SPAR Environ. Syst., Brampton, Ont., Canada
Abstract :
The noise performance in a dose rate environment of a dielectrically isolated JFET operational amplifier at the onset of irradiation and with respect to total dose is presented. Comparison to previously reported results are made
Keywords :
JFET circuits; circuit noise; gamma-ray effects; isolation technology; operational amplifiers; JFET operational amplifier; dielectric isolation; dose rate; irradiation; noise; total dose; Airports; Cameras; Circuit testing; Degradation; Dielectrics; Noise measurement; Operational amplifiers; Performance evaluation; Signal analysis; Working environment noise;
Conference_Titel :
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location :
Indian Wells, CA
Print_ISBN :
0-7803-3398-5
DOI :
10.1109/REDW.1996.574181
