DocumentCode
2832370
Title
Radiation effects in analog CMOS analog-to-digital converters
Author
Turflinger, Thomas L. ; Davey, Martin V. ; Bings, John P.
Author_Institution
Div. Crane, Naval Surface Warfare Center, Crane, IN, USA
fYear
1996
fDate
35265
Firstpage
6
Lastpage
12
Abstract
Analog CMOS circuitry is becoming common in the marketplace. Two commercial ADC are tested in the total dose and dose rate environments. Test results and applicability to system use are discussed
Keywords
CMOS analogue integrated circuits; analogue-digital conversion; gamma-ray effects; analog CMOS circuitry; analog-to-digital converter; dose rate; radiation effect; total dose; CMOS technology; Circuit testing; Clocks; Degradation; Frequency; MOS capacitors; Radiation effects; Resistors; Switched capacitor circuits; Switching converters;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location
Indian Wells, CA
Print_ISBN
0-7803-3398-5
Type
conf
DOI
10.1109/REDW.1996.574182
Filename
574182
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