Title :
A compendium of recent total dose data on bipolar linear microcircuits
Author :
Pease, R.L. ; Combs, W.E. ; Johnston, A. ; Carriere, T. ; Poivey, C. ; Gach, A. ; McClure, S.
Author_Institution :
RLP Res., Albuquerque, NM, USA
Abstract :
Many conventional bipolar linear microcircuits used in space systems have shown a dose rate sensitivity to total dose degradation. Dose rate data, taken by several agencies, have been combined and presented in terms of sensitive parameter shifts at a fixed dose and dose rate enhancements factors
Keywords :
bipolar analogue integrated circuits; gamma-ray effects; space vehicle electronics; bipolar linear microcircuit; dose rate; space system; total dose; Aluminum; Annealing; Circuit testing; Cranes; Degradation; Linear circuits; Performance evaluation; Propulsion; Space vehicles; Standards development;
Conference_Titel :
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location :
Indian Wells, CA
Print_ISBN :
0-7803-3398-5
DOI :
10.1109/REDW.1996.574185
