• DocumentCode
    2832437
  • Title

    A compendium of recent total dose data on bipolar linear microcircuits

  • Author

    Pease, R.L. ; Combs, W.E. ; Johnston, A. ; Carriere, T. ; Poivey, C. ; Gach, A. ; McClure, S.

  • Author_Institution
    RLP Res., Albuquerque, NM, USA
  • fYear
    1996
  • fDate
    35265
  • Firstpage
    28
  • Lastpage
    37
  • Abstract
    Many conventional bipolar linear microcircuits used in space systems have shown a dose rate sensitivity to total dose degradation. Dose rate data, taken by several agencies, have been combined and presented in terms of sensitive parameter shifts at a fixed dose and dose rate enhancements factors
  • Keywords
    bipolar analogue integrated circuits; gamma-ray effects; space vehicle electronics; bipolar linear microcircuit; dose rate; space system; total dose; Aluminum; Annealing; Circuit testing; Cranes; Degradation; Linear circuits; Performance evaluation; Propulsion; Space vehicles; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1996., IEEE
  • Conference_Location
    Indian Wells, CA
  • Print_ISBN
    0-7803-3398-5
  • Type

    conf

  • DOI
    10.1109/REDW.1996.574185
  • Filename
    574185
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2832437