DocumentCode
2832553
Title
Complex express TEC testing
Author
Yershova, L.B. ; Gromov, G.G. ; Drabkin, I.A.
Author_Institution
RMT Ltd 53
fYear
2003
fDate
17-21 Aug. 2003
Firstpage
504
Lastpage
507
Abstract
For fast (express) quality control of Thermoelectric (TE) Coolers (TEC) in manufacturing &d application, electrical resistance (R) and Figure-of-Merit (Z) measurements are widely used. Here it is shown that there are TEC damage or defect instances not covered by one-parameter testing (R) and even two-parameter testing (QZ). We offer a three-parameter approach to control TEC´s quality: by measuring TEC electrical resistance (R), Figure-of-Merit (Z) and time constant (τ). This method provides possibilities to diagnose TEC defects, which is of vital concern for technology and operational conditions correction. The paper yields theoretical and experimental results proving it. The experimental check is provided with the help of the original testing device R,Z,τ-meter DX3065.
Keywords
Conducting materials; Electric resistance; Electrical resistance measurement; Manufacturing; Testing; Thermal conductivity; Thermoelectricity;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Conference_Location
La Grande Motte, France
Print_ISBN
0-7803-8301-X
Type
conf
DOI
10.1109/ICT.2003.1287559
Filename
1287559
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