• DocumentCode
    2832553
  • Title

    Complex express TEC testing

  • Author

    Yershova, L.B. ; Gromov, G.G. ; Drabkin, I.A.

  • Author_Institution
    RMT Ltd 53
  • fYear
    2003
  • fDate
    17-21 Aug. 2003
  • Firstpage
    504
  • Lastpage
    507
  • Abstract
    For fast (express) quality control of Thermoelectric (TE) Coolers (TEC) in manufacturing &d application, electrical resistance (R) and Figure-of-Merit (Z) measurements are widely used. Here it is shown that there are TEC damage or defect instances not covered by one-parameter testing (R) and even two-parameter testing (QZ). We offer a three-parameter approach to control TEC´s quality: by measuring TEC electrical resistance (R), Figure-of-Merit (Z) and time constant (τ). This method provides possibilities to diagnose TEC defects, which is of vital concern for technology and operational conditions correction. The paper yields theoretical and experimental results proving it. The experimental check is provided with the help of the original testing device R,Z,τ-meter DX3065.
  • Keywords
    Conducting materials; Electric resistance; Electrical resistance measurement; Manufacturing; Testing; Thermal conductivity; Thermoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
  • Conference_Location
    La Grande Motte, France
  • Print_ISBN
    0-7803-8301-X
  • Type

    conf

  • DOI
    10.1109/ICT.2003.1287559
  • Filename
    1287559