DocumentCode
2832637
Title
Simulated annealing algorithm for the fault covering of redundant RAMs
Author
Chee, Yeow-Meng ; Leong, Hon-Wai ; Lim, Andrew ; Low, Chor-Ping
Author_Institution
Inf. Technol. Inst., Nat. Comput. Board, Singapore
fYear
1991
fDate
11-14 Jun 1991
Firstpage
2144
Abstract
The authors present a fast simulated annealing algorithm for the problem of fault covering of redundant RAMs. The authors propose a simple representation of repair solutions from which they derive a natural definition of moves and neighboring solutions. The algorithm has been implemented and tested on some benchmark problems. The results show that the method not only produces very good quality solutions, but also runs very fast. In fact, for all the repairable chips, the simulated annealing algorithm finds a repair solution within a second for various problem sizes
Keywords
circuit analysis computing; fault tolerant computing; random-access storage; redundancy; simulated annealing; fault covering; moves; neighboring solutions; redundant RAMs; repair solutions; simulated annealing algorithm; Benchmark testing; Bipartite graph; Computer science; Decoding; Performance evaluation; Production; Random access memory; Read-write memory; Simulated annealing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN
0-7803-0050-5
Type
conf
DOI
10.1109/ISCAS.1991.176710
Filename
176710
Link To Document