DocumentCode :
2832637
Title :
Simulated annealing algorithm for the fault covering of redundant RAMs
Author :
Chee, Yeow-Meng ; Leong, Hon-Wai ; Lim, Andrew ; Low, Chor-Ping
Author_Institution :
Inf. Technol. Inst., Nat. Comput. Board, Singapore
fYear :
1991
fDate :
11-14 Jun 1991
Firstpage :
2144
Abstract :
The authors present a fast simulated annealing algorithm for the problem of fault covering of redundant RAMs. The authors propose a simple representation of repair solutions from which they derive a natural definition of moves and neighboring solutions. The algorithm has been implemented and tested on some benchmark problems. The results show that the method not only produces very good quality solutions, but also runs very fast. In fact, for all the repairable chips, the simulated annealing algorithm finds a repair solution within a second for various problem sizes
Keywords :
circuit analysis computing; fault tolerant computing; random-access storage; redundancy; simulated annealing; fault covering; moves; neighboring solutions; redundant RAMs; repair solutions; simulated annealing algorithm; Benchmark testing; Bipartite graph; Computer science; Decoding; Performance evaluation; Production; Random access memory; Read-write memory; Simulated annealing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
Type :
conf
DOI :
10.1109/ISCAS.1991.176710
Filename :
176710
Link To Document :
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