• DocumentCode
    2832637
  • Title

    Simulated annealing algorithm for the fault covering of redundant RAMs

  • Author

    Chee, Yeow-Meng ; Leong, Hon-Wai ; Lim, Andrew ; Low, Chor-Ping

  • Author_Institution
    Inf. Technol. Inst., Nat. Comput. Board, Singapore
  • fYear
    1991
  • fDate
    11-14 Jun 1991
  • Firstpage
    2144
  • Abstract
    The authors present a fast simulated annealing algorithm for the problem of fault covering of redundant RAMs. The authors propose a simple representation of repair solutions from which they derive a natural definition of moves and neighboring solutions. The algorithm has been implemented and tested on some benchmark problems. The results show that the method not only produces very good quality solutions, but also runs very fast. In fact, for all the repairable chips, the simulated annealing algorithm finds a repair solution within a second for various problem sizes
  • Keywords
    circuit analysis computing; fault tolerant computing; random-access storage; redundancy; simulated annealing; fault covering; moves; neighboring solutions; redundant RAMs; repair solutions; simulated annealing algorithm; Benchmark testing; Bipartite graph; Computer science; Decoding; Performance evaluation; Production; Random access memory; Read-write memory; Simulated annealing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1991., IEEE International Sympoisum on
  • Print_ISBN
    0-7803-0050-5
  • Type

    conf

  • DOI
    10.1109/ISCAS.1991.176710
  • Filename
    176710