Title :
Single event effect proton and heavy ions test results for Ethernet local area network commercial devices
Author :
Poivey, C. ; Garnier, P. ; Carriere, T. ; Nagel, J.
Author_Institution :
Matra Marconi Space, Velizy Villacoublay, France
Abstract :
We present proton and heavy ion single event effect (SEE) ground test results for candidate spacecraft commercial electronics. Device types are IEEE802.3 (ETHERNET) Local Area Network (LAN) controllers, repeaters and transceivers
Keywords :
ion beam effects; local area networks; proton effects; space vehicle electronics; Ethernet local area network; IEEE802.3 device; controller; ground testing; heavy ion irradiation; proton irradiation; repeater; single event effect; spacecraft electronics; transceiver; Aerospace electronics; Aerospace testing; Electronic equipment testing; Ethernet networks; Local area networks; Memory management; Performance evaluation; Protons; Repeaters; Space vehicles;
Conference_Titel :
Radiation Effects Data Workshop, 1996., IEEE
Conference_Location :
Indian Wells, CA
Print_ISBN :
0-7803-3398-5
DOI :
10.1109/REDW.1996.574192
