• DocumentCode
    2832891
  • Title

    Integrating distance metric learning into label propagation model for multi-label image annotation

  • Author

    Wang, Bin ; Shen, Yi ; Liu, Yuncai

  • Author_Institution
    Inst. of Image Process. & Pattern Recognition, Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2011
  • fDate
    11-14 Sept. 2011
  • Firstpage
    3649
  • Lastpage
    3652
  • Abstract
    Existing approaches for automatic image annotation usually suffer from two issues: (1) lacking a good quality distance metric for image semantic similarity measure; (2) rarely considering the correlation between labels assigned to each image. In this paper, we aim to resolve both of the problems simultaneously in a novel unified framework. Specifically, a proper distance metric is learned based on the structural SVM in a discriminative manner, which can optimize the ranking of the images induced by distances from a test image. Subsequently, a collaborative label propagation algorithm is leveraged to model the correlation between class labels in an explicit manner. Also, the learned metric is embedded in the propagation model. The integration of the two components leads to more accurate annotation results. The experiments conducted on the Corel dataset demonstrate the effectiveness of the proposed unified framework.
  • Keywords
    image retrieval; support vector machines; Corel dataset; automatic image annotation; collaborative label propagation; distance metric learning; image semantic similarity measure; label propagation model; multilabel image annotation; quality distance metric; structural SVM; Conferences; Correlation; Image processing; Measurement; Semantics; Support vector machines; Training; Automatic image annotation; distance metric learning; label correlation; label propagation; ranking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2011 18th IEEE International Conference on
  • Conference_Location
    Brussels
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4577-1304-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2011.6116509
  • Filename
    6116509