DocumentCode
2832904
Title
Test bench for measuring the electrical properties of commercial thermoelectric modules
Author
Vizquez, J. ; Palacios, Rafael ; Sanz-Bobi, Miguel A. ; Arenas, Antonio
Author_Institution
Univ. Pontificia Comillas, Instituto de Investigacion Tecnolegica, Madrid, Spain
fYear
2003
fDate
17-21 Aug. 2003
Firstpage
589
Lastpage
593
Abstract
One of the most promising applications of thermoelectricity is the recovery of waste heat for the production of electrical energy. Nowadays, several thermoelectric companies manufacture commercial thermoelectric modules (TEMs) based on Bi2Te3 compounds specially designed to perform as Seebeck modules.. This paper describes a test bench (geometry, materials, measuring equipment) to analyse the behaviour of this type of modules working under several temperature differences (ΔTs). This allows to estimate the potential electric power generated in an application where the optimum AT cannot be achieved because the amount of heat supplied by the heat source is too small, or there is a limitation in the heat dissipation capacity at the cold side. The paper also shows the results obtained using two commercial modules tested under different working conditions. Plots of voltage, electrical power generated, and efficiency versus electric current generated are also included.
Keywords
Seebeck effect; bismuth compounds; thermoelectric conversion; Bi2Te3; Bi2Te3 compounds; Seebeck modules; commercial thermoelectric modules; efficiency versus electric current generated; electrical energy; electrical power generated; electrical properties; geometry; heat dissipation capacity; materials; measuring equipment; potential electric power; test bench; voltage; waste heat; Bismuth; Electric variables measurement; Heat recovery; Manufacturing; Power generation; Production; Resistance heating; Testing; Thermoelectricity; Waste heat;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN
0-7803-8301-X
Type
conf
DOI
10.1109/ICT.2003.1287582
Filename
1287582
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