Title :
Techniques for test output response analysis
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
When a digital part is tested using automatic test equipment (ATE) the correct output response is usually stored in the ATE memory and matched with the actual test response. If a part is tested using a built-in self-test (BIST) scheme the entire test response is too lengthy to be stored in the part and some reduced version of the response must be used. The reduction of test response data is discussed. There is one special situation that occurs when more than one copy of the digital part is available. In this case, the output response of the identical parts can be compared and no response data storage is required. A discussion is presented of arbitrary parts that must have their test response analyzed without any assumptions about their internal structure
Keywords :
automatic test equipment; built-in self test; integrated circuit testing; logic testing; ATE; BIST; automatic test equipment; built-in self-test; identical parts; response compaction; response data storage; test output response analysis; test response data reduction; Automatic test equipment; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Costs; Current supplies; Linear feedback shift registers; Memory;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176771
