Title :
Relating aliasing in signature analysis to test length and register design
Author :
Franco, Piero ; Saxena, Nirmal ; McCluskey, Edward J.
Author_Institution :
Comput. Syst. Lab., Stanford Univ., CA, USA
Abstract :
Recently derived upper bounds on the aliasing probability for serial signature analysis using the Bernoulli error model are reviewed. Since the bit error probability p is unrestricted in general, upper bounds independent of p are emphasized. It is also shown that even for exhaustive testing, the aliasing probability for non-primitive polynomials with short periods does not reach its asymptotic value of all p
Keywords :
logic testing; signal processing; Bernoulli error model; aliasing probability; bit error probability; exhaustive testing; register design; response compaction; signature analysis; test length; upper bounds; Error probability; Polynomials; Testing; Upper bound;
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
DOI :
10.1109/ISCAS.1991.176776
