DocumentCode :
2833694
Title :
Robust Vera coding techniques for gate-level and tester-compliant SoC verification environments
Author :
Litterick, Mark ; Geishauser, Joachim
Author_Institution :
Verilab Ltd., Scotland, UK
fYear :
2004
fDate :
9-10 Sept. 2004
Firstpage :
64
Lastpage :
78
Abstract :
Real world requirements such as low-power modes of operation and multiple clock domains often necessitate gate-level system-on-chip (SoC) verification environments. Additional complexities introduced by tester compliance impose restrictions on the control and repeatability of simulations over all situations, including register-transfer-level (RTL) and different gate-level conditions. Making full use of the Vera high-level verification language in these circumstances requires special considerations and techniques not normally applied in a module-level RTL testbench. If the intent is to reuse Vera monitors, drivers and result-checkers in the gate-level SoC environment then the code must be designed appropriately. This paper first explores the generic issues of interacting with a gate-level SoC in a tester compliant manner and then proceeds to derive Vera coding guidelines that ensure robust operation across a range of testbench abstractions from module-level RTL through to tester-compliant gate-level SoC implementations.
Keywords :
circuit complexity; circuit simulation; formal verification; hardware description languages; hardware-software codesign; system-on-chip; Vera drivers; Vera high-level verification language; Vera monitors; gate-level system-on-chip verification environments; module-level RTL testbench; register-transfer-level; result-checkers; robust Vera coding; testbench abstractions; tester compliance; tester-compliant gate-level SoC implementations; Clocks; Guidelines; Interference constraints; Logic testing; Robustness; Semiconductor device testing; Software testing; System testing; System-on-a-chip; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocessor Test and Verification (MTV'04), Fifth International Workshop on
ISSN :
1550-4093
Print_ISBN :
0-7695-2320-X
Type :
conf
DOI :
10.1109/MTV.2004.22
Filename :
1563075
Link To Document :
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