Abstract :
The following topics are dealt with: mixed signal testing; RF test; analog test; ATPG; VLSI design; built-in self test; embedded software system; FPGA test; failure analysis; network-on chip design; low-power design; design for testability; signal processing; CAD tool; EDA tool; system-in package; RFID system; and digital satellite television.
Keywords :
VLSI; automatic test pattern generation; built-in self test; circuit CAD; design for testability; digital television; direct broadcasting by satellite; embedded systems; field programmable gate arrays; integrated circuit design; logic testing; low-power electronics; network-on-chip; radiofrequency identification; signal processing; system-on-package; ATPG; CAD tool; EDA tool; FPGA test; RF test; RFID system; VLSI design; analog test; built-in self test; design for testability; digital satellite television; embedded software system; low-power design; mixed signal testing; network-on chip design; signal processing; system-in package;
Conference_Titel :
Design & Test Symposium (EWDTS), 2011 9th East-West
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-1957-8
DOI :
10.1109/EWDTS.2011.6116566
