Title :
The Research of V Model in Testing Embedded Software
Author :
Shuping, Liu ; Ling, Pang
Author_Institution :
North China Electr. Power Univ., Beijing
fDate :
Aug. 29 2008-Sept. 2 2008
Abstract :
Software testing is an important link of software quality guarantee, regarding to the embedded software testing that is much more compelxed, needing a clear stage development test model that better controlled. The article discussed the model that already existed, further excavates the parallelism between test stages, trys to proposes a improved V model, This model make the software testing pass through the each stage of software development cycle, That can discover software mistakes as early as possible simultaneously unify the actual small software development project-GPRS extender board correspondence experiment, has proven the accuracy and the validity of this model.
Keywords :
embedded systems; program testing; software quality; V model; embedded software testing; software development cycle; software quality; Concrete; Embedded software; Hardware; Power system modeling; Programming; Software performance; Software quality; Software testing; Solid modeling; System testing; TDD; improved V model; software testing;
Conference_Titel :
Computer Science and Information Technology, 2008. ICCSIT '08. International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-0-7695-3308-7
DOI :
10.1109/ICCSIT.2008.51