• DocumentCode
    2833984
  • Title

    The Research of V Model in Testing Embedded Software

  • Author

    Shuping, Liu ; Ling, Pang

  • Author_Institution
    North China Electr. Power Univ., Beijing
  • fYear
    2008
  • fDate
    Aug. 29 2008-Sept. 2 2008
  • Firstpage
    463
  • Lastpage
    466
  • Abstract
    Software testing is an important link of software quality guarantee, regarding to the embedded software testing that is much more compelxed, needing a clear stage development test model that better controlled. The article discussed the model that already existed, further excavates the parallelism between test stages, trys to proposes a improved V model, This model make the software testing pass through the each stage of software development cycle, That can discover software mistakes as early as possible simultaneously unify the actual small software development project-GPRS extender board correspondence experiment, has proven the accuracy and the validity of this model.
  • Keywords
    embedded systems; program testing; software quality; V model; embedded software testing; software development cycle; software quality; Concrete; Embedded software; Hardware; Power system modeling; Programming; Software performance; Software quality; Software testing; Solid modeling; System testing; TDD; improved V model; software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Information Technology, 2008. ICCSIT '08. International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-0-7695-3308-7
  • Type

    conf

  • DOI
    10.1109/ICCSIT.2008.51
  • Filename
    4624911