DocumentCode
2833984
Title
The Research of V Model in Testing Embedded Software
Author
Shuping, Liu ; Ling, Pang
Author_Institution
North China Electr. Power Univ., Beijing
fYear
2008
fDate
Aug. 29 2008-Sept. 2 2008
Firstpage
463
Lastpage
466
Abstract
Software testing is an important link of software quality guarantee, regarding to the embedded software testing that is much more compelxed, needing a clear stage development test model that better controlled. The article discussed the model that already existed, further excavates the parallelism between test stages, trys to proposes a improved V model, This model make the software testing pass through the each stage of software development cycle, That can discover software mistakes as early as possible simultaneously unify the actual small software development project-GPRS extender board correspondence experiment, has proven the accuracy and the validity of this model.
Keywords
embedded systems; program testing; software quality; V model; embedded software testing; software development cycle; software quality; Concrete; Embedded software; Hardware; Power system modeling; Programming; Software performance; Software quality; Software testing; Solid modeling; System testing; TDD; improved V model; software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Information Technology, 2008. ICCSIT '08. International Conference on
Conference_Location
Singapore
Print_ISBN
978-0-7695-3308-7
Type
conf
DOI
10.1109/ICCSIT.2008.51
Filename
4624911
Link To Document