Title :
High-speed, high-power switching of semiconductor devices
Author :
Okamura, K. ; Watanabe, Y. ; Ohshima, I. ; Yanabu, S.
Author_Institution :
Toshiba Corporation
Keywords :
Circuit testing; Insulated gate bipolar transistors; Modular construction; Power semiconductor switches; Prototypes; Pulse power systems; Pulse transformers; Semiconductor devices; Thyristors; Voltage;
Conference_Titel :
Pulsed Power Conference, 1989. 7th
DOI :
10.1109/PPC.1989.767617