DocumentCode :
2834074
Title :
Bayesian wavelet-based image denoising using Markov Random Field models
Author :
Cui, Yanqiu ; Zhang, Tao ; Xu, Shuang ; Li, Houjie
Author_Institution :
Coll. of Electromech. & Inf. Eng., Dalian Nat. Univ., Dalian, China
Volume :
1
fYear :
2010
fDate :
22-24 Oct. 2010
Abstract :
This paper presents a Bayesian denoising method based on Markov Random Field (MRF) models in wavelet domain in order to improve the image denoising performance and reduce the computational complexity. The computations of the initial mask, optimal mask and shrinkage factor of the wavelet coefficient are the core of this method. To obtain the appropriate initial mask, a simple two-state Gaussian mixture model is constructed and an estimation method of the initial mask based on the maximum a posteriori (MAP) criterion is proposed. Based on this initial mask, an optimal mask is obtained. To reduce the computational complexity of the optimal mask, a simple optimization method, the iterated conditional modes (ICM) method is adopted. A Bayesian wavelet shrinkage factor is derived based on this optical mask. Under this framework, the computational complexity of the denoising method can be reduced. Simulation results demonstrate our proposed method has a good denoising performance while reducing the computational complexity.
Keywords :
Gaussian processes; Markov processes; belief networks; computational complexity; image denoising; maximum likelihood estimation; optimisation; shrinkage; wavelet transforms; Bayesian denoising method; Bayesian wavelet based image denoising; Gaussian mixture model; Markov random field model; computational complexity; estimation method; iterated conditional modes method; maximum a posteriori criterion; shrinkage factor; wavelet coefficient; wavelet domain; Bayesian methods; Computational modeling; IEL; Spline; Bayesian estimation; Markov Random Field; image denoising; wavelet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
Type :
conf
DOI :
10.1109/ICCASM.2010.5620417
Filename :
5620417
Link To Document :
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