Title :
A mechanism for surface flashover of semiconductors
Author :
Williams, P.F. ; Peterkin, F.E.
Author_Institution :
University of Nebraska-Lincoln
Keywords :
Avalanche breakdown; Breakdown voltage; Dielectric breakdown; Dielectric materials; Flashover; Insulation; Photoconducting devices; Silicon; Sulfur hexafluoride; Switches;
Conference_Titel :
Pulsed Power Conference, 1989. 7th
DOI :
10.1109/PPC.1989.767632
