Title :
Lifetime testing of commercially available 3.0 μf, 100 kv pulsed-power capacitors
Author :
Schneider, L.X. ; Babcock, S.R. ; Laderach, G.E.
Author_Institution :
Sandia National Laboratories
Keywords :
Automatic testing; Capacitors; Dielectrics; Electrodes; Laboratories; Life testing; Sparks; Statistics; System testing; Voltage;
Conference_Titel :
Pulsed Power Conference, 1989. 7th
DOI :
10.1109/PPC.1989.767635