Title :
How to know when you´ve been zapped, or practical techniques for selecting a reliable attenuator for use in high voltage pulse measurements
Author :
Richner, John R. ; Askin, Thomas O.
Author_Institution :
Barth Electronics, Inc.
Keywords :
Attenuation measurement; Attenuators; Bandwidth; Breakdown voltage; Connectors; Electrical resistance measurement; Energy measurement; History; Pulse measurements; Voltage measurement;
Conference_Titel :
Pulsed Power Conference, 1989. 7th
DOI :
10.1109/PPC.1989.767639