DocumentCode :
2834616
Title :
Automated test bench generation for high-level synthesis flow ABELITE
Author :
Viilukas, Taavi ; Jenihhin, Maksim ; Raik, Jaan ; Ubar, Raimund ; Baranov, Samary
Author_Institution :
Tallinn Univ. of Technol., Tallinn, Estonia
fYear :
2011
fDate :
9-12 Sept. 2011
Firstpage :
13
Lastpage :
16
Abstract :
The paper presents an approach for integration of automatic test bench generation based on a hierarchical test pattern generator Decider into the high-level synthesis flow Abelite. While the high-level synthesis flow provides fast results of complex systems design, functional verification of the design including initial specification has remained until now a sophisticated manual process. The automatically generated test benches provide high code coverage for simulation and are readable for debug. The experiments demonstrate viability and efficiency of the proposed approach.
Keywords :
automatic test pattern generation; high level synthesis; ABELITE; automated test bench generation; hierarchical test pattern generator; high code coverage; high level synthesis flow; Algorithm design and analysis; Circuit faults; Digital systems; Hardware design languages; Object oriented modeling; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium (EWDTS), 2011 9th East-West
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4577-1957-8
Type :
conf
DOI :
10.1109/EWDTS.2011.6116601
Filename :
6116601
Link To Document :
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