DocumentCode
283469
Title
Integrated test generation tools
Author
Bayliss, J.S.
Author_Institution
GenRad Ltd., Fareham, UK
fYear
1988
fDate
32419
Firstpage
42401
Lastpage
42403
Abstract
A single test generation tool cannot generate tests for today´s designs unless designers are prepared to restrict themselves to certain limited types of circuitry. In general therefore, a number of test generation tools is required and to gain maximum benefit the tools should cooperate in an integrated environment
Keywords
automatic test equipment; integrated circuit testing; printed circuit testing; ATE; IC testing; PCB; integrated environment; test generation tools;
fLanguage
English
Publisher
iet
Conference_Titel
Computer Aided Test and Diagnosis, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
209474
Link To Document