Title :
Integrated test generation tools
Author_Institution :
GenRad Ltd., Fareham, UK
Abstract :
A single test generation tool cannot generate tests for today´s designs unless designers are prepared to restrict themselves to certain limited types of circuitry. In general therefore, a number of test generation tools is required and to gain maximum benefit the tools should cooperate in an integrated environment
Keywords :
automatic test equipment; integrated circuit testing; printed circuit testing; ATE; IC testing; PCB; integrated environment; test generation tools;
Conference_Titel :
Computer Aided Test and Diagnosis, IEE Colloquium on
Conference_Location :
London
