DocumentCode :
2834820
Title :
Smart grids power quality analysis based in classification techniques and higher-order statistics: Proposal for photovoltaic systems
Author :
Carlos Palomares-Salas, Jose ; Gonzalez de la Rosa, Juan Jose ; Aguera-Perez, Agustin ; Sierra-Fernandez, Jose Maria
Author_Institution :
Res. Group in Comput. Instrum. & Ind. Electron. (PAIDI-TIC-168), Univ. of Cadiz. Electron., Algeciras, Spain
fYear :
2015
fDate :
17-19 March 2015
Firstpage :
2955
Lastpage :
2959
Abstract :
This paper compares classification techniques to identify several power quality disturbances in a frame of smart metering design for smart grids with high penetration of PV systems. These techniques are: Linear Discriminant Analysis (LDA), Nearest Neighbor Method (kNN), Learning Vector Quantization (LVQ) and Support Vector Machine (SVM). For this purpose, fourteen power-quality features based in higher-order statistics are used to assist classification. Special attention is paid to the spectral kurtosis, whose nature enables measurement options related to the impulsiveness of the power quality events. The best technique of those compared is selected according to correlation and mistake rates. Results clearly reveal the potential capability of the methodology in classifying the single disturbances. Concretely, the SVM classifier obtained an average correlation rate of 99%. Hence, concluding that it is a robust classification method.
Keywords :
higher order statistics; learning (artificial intelligence); pattern classification; photovoltaic power systems; power engineering computing; power supply quality; smart power grids; support vector machines; LDA; LVQ; SVM; SVM classifier; classification technique; higher-order statistics; kNN; learning vector quantization; linear discriminant analysis; nearest neighbor method; photovoltaic systems; smart grids power quality analysis; support vector machine; Correlation; Feature extraction; Frequency-domain analysis; Higher order statistics; Power quality; Support vector machines; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology (ICIT), 2015 IEEE International Conference on
Conference_Location :
Seville
Type :
conf
DOI :
10.1109/ICIT.2015.7125534
Filename :
7125534
Link To Document :
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