• DocumentCode
    283490
  • Title

    Verifying the safety of digital in-circuit testing

  • Author

    Wilkinson, Graham

  • Author_Institution
    Marconi Instrum., St. Albans, UK
  • fYear
    1988
  • fDate
    32437
  • Firstpage
    42401
  • Lastpage
    42404
  • Abstract
    The author describes a method of verifying the safety of in-circuit tests by using a software package to examine the test. During a device test inputs are driven high and low, and outputs are being monitored. Most input legs of devices on a board are electrically connected to output pins, whether on the same device or not, so corresponding outputs are driven as well. This is referred to as backdriving. To obtain the best performance of speed vs. accuracy a two level design is the best compromise, because typically 80% of tests will pass the first stage. The ability to follow flow control in both the generation and execution of tests enables the effect of faults causing branches to possibly hazardous code can be evaluated
  • Keywords
    automatic testing; digital integrated circuits; integrated circuit testing; safety; accuracy; backdriving; digital in-circuit testing; performance; safety; software package; speed; two level design;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Techniques for Testing and Measuring Digital Systems, IEE Colloquium on
  • Conference_Location
    London
  • Type

    conf

  • Filename
    209503