Title :
Probabilistic fault diagnosis
Author_Institution :
Cranfield Inst. of Technol., Bedford, UK
Abstract :
Probabilistic diagnostic methods are described. This approach to diagnosis has application in systems where a number of faulty states can be tolerated. Such situations exist in certain fault-tolerant computational assemblies and also in some `AI´ systems. Particular applications of the latter type include hypothesis testing, pattern recognition and learning systems. Probabilistic diagnostic methods may also find application in systems employing computational fuzzy logic where the data is normally imprecise and a certain amount of error can be tolerated
Keywords :
artificial intelligence; computer testing; electronic equipment testing; fault tolerant computing; learning systems; logic testing; pattern recognition; artificial intelligence; computational fuzzy logic; fault-tolerant computational assemblies; faulty states; hypothesis testing; learning systems; logic testing; pattern recognition; probabilistic fault diagnosis;
Conference_Titel :
Techniques for Testing and Measuring Digital Systems, IEE Colloquium on
Conference_Location :
London
