Title :
Low-cost tester, toybox or toolbox
Author_Institution :
Marconi Instrum., St. Albans, UK
Abstract :
In 1988, the low-cost ATE market (<£50 K) is gaining increasing popularity at the expense of the large (mainframe) ATE market (£50 K to £500 K). This is being achieved by the migration of the sophisticated test techniques from the larger tester to the low-cost tester. This cost effective migration is only being made possible through the widening use of VLSI devices and gate-array technology. The author highlights the digital test techniques and the quality of test which is supported by several low-cost ATE manufacturers
Keywords :
automatic test equipment; digital instrumentation; economics; electronic equipment testing; integrated circuit testing; production testing; IC testing; VLSI devices; digital test; electronic equipment testing; gate-array technology; low-cost ATE; production testing;
Conference_Titel :
Techniques for Testing and Measuring Digital Systems, IEE Colloquium on
Conference_Location :
London
