• DocumentCode
    2834999
  • Title

    A design and test technique for embedded software

  • Author

    Kang, Byeongdo ; Kwon, Young-Jik ; Lee, Roger Y.

  • Author_Institution
    Dept. of Comput. & Inf. Technol., Daegu Univ., South Korea
  • fYear
    2005
  • fDate
    11-13 Aug. 2005
  • Firstpage
    160
  • Lastpage
    165
  • Abstract
    In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for new services, embedded software gradually grow in size, and development costs and time are increasing. In order to overcome this serious matter, we need a customized design and test technique for embedded software. In this paper, we present a software architecture style for embedded software. It facilitates the composition of reusable functions and helps developers to reduce development time. Because the costs associated with revealing errors of embedded software in applications are rising, we propose a test method and tools for target environments.
  • Keywords
    embedded systems; program testing; software architecture; software reusability; software tools; embedded software architecture; embedded software design; embedded software testing; embedded systems; reusable functions; Application software; Costs; Embedded computing; Embedded software; Embedded system; Hardware; Microprocessors; Operating systems; Software testing; Time to market; Embedded Software; Software Design; Software Test.;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Research, Management and Applications, 2005. Third ACIS International Conference on
  • Print_ISBN
    0-7695-2297-1
  • Type

    conf

  • DOI
    10.1109/SERA.2005.6
  • Filename
    1563157