Title :
A design and test technique for embedded software
Author :
Kang, Byeongdo ; Kwon, Young-Jik ; Lee, Roger Y.
Author_Institution :
Dept. of Comput. & Inf. Technol., Daegu Univ., South Korea
Abstract :
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for new services, embedded software gradually grow in size, and development costs and time are increasing. In order to overcome this serious matter, we need a customized design and test technique for embedded software. In this paper, we present a software architecture style for embedded software. It facilitates the composition of reusable functions and helps developers to reduce development time. Because the costs associated with revealing errors of embedded software in applications are rising, we propose a test method and tools for target environments.
Keywords :
embedded systems; program testing; software architecture; software reusability; software tools; embedded software architecture; embedded software design; embedded software testing; embedded systems; reusable functions; Application software; Costs; Embedded computing; Embedded software; Embedded system; Hardware; Microprocessors; Operating systems; Software testing; Time to market; Embedded Software; Software Design; Software Test.;
Conference_Titel :
Software Engineering Research, Management and Applications, 2005. Third ACIS International Conference on
Print_ISBN :
0-7695-2297-1
DOI :
10.1109/SERA.2005.6