Title :
IEE Colloquium on `Custom VLSI Design and Test´ (Digest No.110)
Abstract :
The following topics topics were dealt with: ASICs; gate arrays; simulation; CAD; full custom; semicustom; testing. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords :
circuit CAD; integrated circuit testing; monolithic integrated circuits;
Conference_Titel :
Custom VLSI Design and Test, IEE Colloquium on
Conference_Location :
London
