DocumentCode
283523
Title
IEE Colloquium on `Custom VLSI Design and Test´ (Digest No.110)
fYear
1988
fDate
32447
Abstract
The following topics topics were dealt with: ASICs; gate arrays; simulation; CAD; full custom; semicustom; testing. Abstracts of individual papers can be found under the relevant classification codes in this or other issues
Keywords
circuit CAD; integrated circuit testing; monolithic integrated circuits;
fLanguage
English
Publisher
iet
Conference_Titel
Custom VLSI Design and Test, IEE Colloquium on
Conference_Location
London
Type
conf
Filename
209542
Link To Document