• DocumentCode
    2835241
  • Title

    A Probabilistic Method for Text Analysis

  • Author

    Clarizia, Fabio ; De Santo, Massimo ; Napoletano, Paolo

  • Author_Institution
    Dept. of Inf. & Electr. Eng., Univ. of Salerno, Fisciano, Italy
  • fYear
    2009
  • fDate
    Nov. 30 2009-Dec. 2 2009
  • Firstpage
    932
  • Lastpage
    937
  • Abstract
    Textual materials are source of extremely valuable information, for which there must be a reflection on the techniques of analysis to be used to avoid subjective interpretations especially in the content. The Textual Analysis (TA), which makes use of statistical techniques, ensures the systematic exploration of the structure of the text (size, occurrence, etc.) and simultaneously the possibility to return at any time to the original text for the appropriate interpretations. In this work we test a new technique based on a probabilistic model of language known in the literature as ¿topic model¿ for analyzing corpora of documents about electromagnetic pollution. The proposed method is able to reveal how the meaning of a document is distributed all along its spectrum (word-frequency) indicating that the real meaning of a document can be inferred following a multilevel analysis. Such analysis is carried out exploiting a new concept of ontology already used in literature and deeply explained here.
  • Keywords
    ontologies (artificial intelligence); probability; statistical analysis; text analysis; electromagnetic pollution; multilevel analysis; ontology; probabilistic method; statistical techniques; systematic exploration; text analysis; textual analysis; textual materials; Electromagnetic analysis; Electromagnetic fields; Electromagnetic modeling; Information analysis; Intelligent systems; Ontologies; Reflection; System analysis and design; Testing; Text analysis; ontology; probabilistic model; text analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Systems Design and Applications, 2009. ISDA '09. Ninth International Conference on
  • Conference_Location
    Pisa
  • Print_ISBN
    978-1-4244-4735-0
  • Electronic_ISBN
    978-0-7695-3872-3
  • Type

    conf

  • DOI
    10.1109/ISDA.2009.26
  • Filename
    5364384