DocumentCode :
2835322
Title :
Patch-based image deconvolution via joint modeling of sparse priors
Author :
Jia, Chao ; Evans, Brian L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
fYear :
2011
fDate :
11-14 Sept. 2011
Firstpage :
681
Lastpage :
684
Abstract :
Image deconvolution aims to recover an image that has been degraded by a linear operation such as blurring during image acquisition. Deconvolution based on maximum a-posteriori (MAP) estimation requires the global prior probability of the original image. Conventional methods usually model the image priors by uniformly characterizing the statistical properties of either some forward measurements of images or the representation coefficients in frames, neglecting the local image statistics. In this paper, we adopt local sparse representation in image deconvolution. Our contributions include proposing (1) a joint model of natural images combining sparse representation of image patches and sparse gradient priors, and (2) an efficient iterative algorithm to infer the MAP estimate of image deconvolution using the proposed model. Experiments indicate that the proposed method can recover the original image with high peak signal-to-noise ratio (PSNR) and structural similarity (SSIM) index compared with state-of-the-art methods.
Keywords :
deconvolution; image representation; image restoration; iterative methods; maximum likelihood estimation; probability; MAP; global prior probability; image acquisition; image forward measurement; iterative algorithm; local image statistics; local sparse representation; maximum a-posteriori estimation; patch-based image deconvolution; peak signal-to-noise ratio; representation coefficients; sparse prior joint modeling; statistical properties; structural similarity index; Convolution; Deconvolution; Dictionaries; Image coding; Joints; Kernel; image de-convolution; image priors; sparse representation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2011 18th IEEE International Conference on
Conference_Location :
Brussels
ISSN :
1522-4880
Print_ISBN :
978-1-4577-1304-0
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2011.6116644
Filename :
6116644
Link To Document :
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