• DocumentCode
    2835386
  • Title

    Technology for faulty blocks coverage by spares

  • Author

    Vladimir, Hahanov ; Svetlana, Chumachenko ; Eugenia, Litvinova ; Oleg, Zakharchenko ; Natalka, Kulbakova

  • Author_Institution
    Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
  • fYear
    2010
  • fDate
    17-20 Sept. 2010
  • Firstpage
    473
  • Lastpage
    478
  • Abstract
    The technology for the minimum coverage of faulty blocks by spares when repairing the logic part of digital system-on-chip is proposed. The general provisions and rules of coverage for the matrix of configurable logic blocks (CLB) with faulty cells are considered. Coverage criteria for faulty cells are developed. Examples of the algorithm implementation are made.
  • Keywords
    electronic engineering computing; system-on-chip; configurable logic block; digital system on chip; faulty block coverage; Computers; Consumer electronics; Field programmable gate arrays; Maintenance engineering; Marketing and sales; System-on-a-chip; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Test Symposium (EWDTS), 2010 East-West
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    978-1-4244-9555-9
  • Type

    conf

  • DOI
    10.1109/EWDTS.2010.5742109
  • Filename
    5742109
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2835386