Title :
Technology for faulty blocks coverage by spares
Author :
Vladimir, Hahanov ; Svetlana, Chumachenko ; Eugenia, Litvinova ; Oleg, Zakharchenko ; Natalka, Kulbakova
Author_Institution :
Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
Abstract :
The technology for the minimum coverage of faulty blocks by spares when repairing the logic part of digital system-on-chip is proposed. The general provisions and rules of coverage for the matrix of configurable logic blocks (CLB) with faulty cells are considered. Coverage criteria for faulty cells are developed. Examples of the algorithm implementation are made.
Keywords :
electronic engineering computing; system-on-chip; configurable logic block; digital system on chip; faulty block coverage; Computers; Consumer electronics; Field programmable gate arrays; Maintenance engineering; Marketing and sales; System-on-a-chip; Tiles;
Conference_Titel :
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4244-9555-9
DOI :
10.1109/EWDTS.2010.5742109
