Title :
Real time test environment for TDX-10 switching system
Author :
Yoon, B.N. ; Kim, J.W. ; Cho, M.H. ; Rhee, W.S. ; Lim, O.S. ; Kwak, D.Y. ; Ko, K.H.
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
To ensure the high reliability of a large scale SPC switching system such as TDX-10 which will be the national standard integrated services digital network (ISDN) switching system in South Korea, rigorous tests should be carried out during the system development life cycle. A presentation is made of the overall requirements of the test environment and the properties of the real environment function test system (REFTS). Sample applications are given to describe how the test environment is used to allow maximum efficiency and productivity
Keywords :
automatic testing; electronic equipment testing; electronic switching systems; ISDN; REFTS; South Korea; TDX-10 switching system; automatic testing; integrated services digital network; large scale SPC switching system; real environment function test system; real time testing; system development life cycle; test environment; Automatic testing; Electronic equipment testing; Environmental management; Large-scale systems; Life testing; Prototypes; Real time systems; Storage automation; Switching systems; System testing;
Conference_Titel :
TENCON '89. Fourth IEEE Region 10 International Conference
Conference_Location :
Bombay
DOI :
10.1109/TENCON.1989.176890
