Title :
On selection of state variables for delay test of identical functional units
Author :
Kajala, Aditi ; Sinsinwar, Gayaprasad ; Choudhary, Rahul Raj ; Tudu, Jaynarayan ; Singh, Virendra
Author_Institution :
Govt. Eng. Coll., Bikaner, India
Abstract :
Multiple copies of the same functional units are common in today´s design. It allows us to reduce golden reference storage by performing comparison of output response of the identical circuits when identical input sequence is applied to them. We present output response comparison scheme for identical sequential circuits for delay test using static transition probability. This allows us to make selection independent of the input sequence.
Keywords :
delays; fault diagnosis; logic testing; probability; sequential circuits; delay test; golden reference storage; identical circuits; identical functional units; identical input sequence; identical sequential circuits; state variable selection; static transition probability; Automatic test pattern generation; Circuit faults; Delay; Fault detection; Probability; Routing;
Conference_Titel :
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4244-9555-9
DOI :
10.1109/EWDTS.2010.5742119
