DocumentCode :
2835574
Title :
Development of the data-driven readout ASIC for microstrip detectors
Author :
Atkin, E. ; Volkov, Yu. ; Klyuev, A. ; Shumihin, V.
Author_Institution :
Moscow Eng. Phys. Inst., Nucl. Res. Univ., Moscow, Russia
fYear :
2010
fDate :
17-20 Sept. 2010
Firstpage :
374
Lastpage :
375
Abstract :
Presented are the results of developing an asynchronous data-driven architecture for multichannel silicon tracker system experiments. A known event statistics in multichannel equipment makes it possible to use new variants of architecture synthesis with use of analog derandomizing blocks. There are discussed the testing and simulation results of separate prototype blocks and the whole system, aimed to achieve a compromise in a set of parameters, focused on power consumption, performance and dead time. The requirements of the silicon tracker station in CBM experiment were used in design.
Keywords :
application specific integrated circuits; elemental semiconductors; integrated circuit testing; microstrip circuits; peak detectors; readout electronics; silicon; Si; analog derandomizing blocks; asynchronous data-driven architecture; data-driven readout ASIC; event statistics; microstrip detectors; multichannel equipment; multichannel silicon tracker system; power consumption; Application specific integrated circuits; Detectors; Hardware design languages; Layout; Power demand; Silicon; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location :
St. Petersburg
Print_ISBN :
978-1-4244-9555-9
Type :
conf
DOI :
10.1109/EWDTS.2010.5742121
Filename :
5742121
Link To Document :
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