• DocumentCode
    2835738
  • Title

    Tool Wear Monitoring using Ant Behaviour

  • Author

    Omkar, S.N. ; U, Raghavendra Karanth

  • Author_Institution
    Indian Inst. of Sci., Bangalore
  • fYear
    2006
  • fDate
    15-17 Dec. 2006
  • Firstpage
    1559
  • Lastpage
    1562
  • Abstract
    In this paper we show the applicability of ant colony optimisation (ACO) techniques for pattern classification problem that arises in tool wear monitoring. In an earlier study, artificial neural networks and genetic programming have been successfully applied to tool wear monitoring problem. ACO is a recent addition to evolutionary computation technique that has gained attention for its ability to extract the underlying data relationships and express them in form of simple rules. Rules are extracted for data classification using training set of data points. These rules are then applied to set of data in the testing/validation set to obtain the classification accuracy. A major attraction in ACO based classification is the possibility of obtaining an expert system like rules that can be directly applied subsequently by the user in his/her application. The classification accuracy obtained in ACO based approach is as good as obtained in other biologically inspired techniques.
  • Keywords
    cutting tools; data mining; evolutionary computation; expert systems; intelligent manufacturing systems; learning (artificial intelligence); monitoring; optimisation; pattern classification; production engineering computing; ACO techniques; ant behaviour; ant colony optimisation; data classification; evolutionary computation technique; expert system; pattern classification problem; rule extraction; tool wear monitoring; training set; Ant colony optimization; Artificial neural networks; Data mining; Expert systems; Insects; Mathematical model; Monitoring; Neural networks; Particle swarm optimization; Pattern classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology, 2006. ICIT 2006. IEEE International Conference on
  • Conference_Location
    Mumbai
  • Print_ISBN
    1-4244-0726-5
  • Electronic_ISBN
    1-4244-0726-5
  • Type

    conf

  • DOI
    10.1109/ICIT.2006.372459
  • Filename
    4237781