DocumentCode
2835819
Title
Self-testing of microcontrollers in the field
Author
Sosnowski, Janusz
Author_Institution
Inst. of Comput. Sci., Warsaw Univ. of Technol., Warsaw, Poland
fYear
2010
fDate
17-20 Sept. 2010
Firstpage
43
Lastpage
46
Abstract
The paper presents our experience with developing tests for microcontroller based embedded systems. We use application specific tests. They are integrated with the implemented application (program) and available on-line error detection mechanisms. The effectiveness of this approach has been analyzed in simulation experiments and referenced to some practical problem in embedded systems.
Keywords
automatic testing; embedded systems; error detection; microcontrollers; application specific test; embedded system; microcontroller; online error detection mechanism; self testing; Computer architecture; Embedded systems; Hardware; Program processors; Random access memory; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design & Test Symposium (EWDTS), 2010 East-West
Conference_Location
St. Petersburg
Print_ISBN
978-1-4244-9555-9
Type
conf
DOI
10.1109/EWDTS.2010.5742137
Filename
5742137
Link To Document