Statistical tracking of nanoparticles using selective plane illumination microscope

In this paper we propose the way to improve the resolution of nanoparticle tracking. We applied for the first time image morphology analysis for high precision particle position detection even when images of several particles overlap one another. To minimize the errors caused by Brownian motion a statistical particle tracking algorithm was used for particles position data processing. Statistical particle tracking velocimetry (SPTV) algorithm was proposed. The successful application of SPTV for nanometer sized particles tracking was also demonstrated. Because of the use of total internal fluorescence microcopy for the particle visualization, all measurements were limited by very thin layer near cover slip surface. In the current paper we demonstrated successful sub-micrometer resolution nanoparticle tracking in the distances up to 0.5 mm away from the walls of micro cuvette.