• DocumentCode
    2836144
  • Title

    Initial results on magnetic induction tomography hardware measurement using hall effect sensor application

  • Author

    Zakaria, Zulkarnay ; Yazid, Noor Aqma Hj Mohd ; Jaafar, Noor Hidayah ; Jumaah, Mohd Fahajumi ; Mansor, Muhammad Saiful Badri ; Rahim, Ruzairi Abdul

  • fYear
    2010
  • fDate
    Nov. 30 2010-Dec. 2 2010
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    Magnetic induction tomography (MIT) is among the new technology that compliment other tomography methods such as ultrasonic, optical, capacitance and several others. This type of tomography applies the magnetic field to detect the existence of the object that is going to image. Several methods are possible in constructing the magnetic induction hardware. Most of the researchers used coils for both transmitter and receiver which are more complicated and need large space. The Hall Effect sensors (HES) have the potential of replacing the coil at the receiver side since it has the ability to measure the value of magnetic field strength and convert it to voltage value. This concept is same as the ultrasonic sensors used in ultrasonic tomography instrumentation hardware. The results have shown that the pattern of capture data by hall effect sensor are almost the same pattern for all 8 sensors for each material used. This have given positive sign that HES is capable to be applied in MIT measurement system.
  • Keywords
    Hall effect devices; electromagnetic induction; sensors; tomography; MIT measurement system; hall effect sensor application; magnetic field; magnetic induction tomography hardware measurement; tomography methods; ultrasonic sensors; ultrasonic tomography instrumentation hardware; Coils; Magnetic field measurement; Magnetic fields; Magnetic resonance imaging; Magnetic sensors; Tomography; Hall Effect sensor; Magnetic Induction; inductor; magnetic field; tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Engineering and Sciences (IECBES), 2010 IEEE EMBS Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-7599-5
  • Type

    conf

  • DOI
    10.1109/IECBES.2010.5742189
  • Filename
    5742189