• DocumentCode
    2836293
  • Title

    Enhancement-mode InP-based HEMT devices and applications

  • Author

    Adesida, I. ; Mahajan, A. ; Cueva, G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    1998
  • fDate
    11-15 May 1998
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    We have established an enhancement/depletion (E/D) InP high electron mobility transistor (HEMT) process. The fabrication and characterization of circuits employing a direct-coupled FET logic (DCFL) technology are demonstrated using this process. A 23-stage ring oscillator was fabricated and tested. A room temperature propagation delay time (τpd) of 16.72 ps/stage as well as a subfemtojoule power-delay product (PDP) of only 0.322 fJ/stage were obtained for the oscillator which, to the best of the authors´ knowledge, is the lowest reported PDP in the InP material system. Also a divide-by-four prescaler was also fabricated and characterized; this demonstrated functionality up to 6 GHz, with a power dissipation of only 5.37 mW/stage. This marks the first time that a prescaler has been fabricated in the InP material system using DCFL technology
  • Keywords
    HEMT integrated circuits; III-V semiconductors; MMIC oscillators; direct coupled FET logic; field effect MMIC; field effect logic circuits; indium compounds; microwave photonics; prescalers; 23-stage ring oscillator; 6 GHz; InP; cascaded divide-by-two circuits; direct-coupled FET logic technology; divide-by-four prescaler; enhancement-mode InP-based HEMT; enhancement/depletion mode; flip flops; lattice matched; monolithic integration; room temperature propagation delay time; subfemtojoule power-delay product; Circuit testing; FETs; Fabrication; HEMTs; Indium phosphide; Logic circuits; Logic devices; MODFETs; Ring oscillators; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1998 International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-4220-8
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1998.712566
  • Filename
    712566