DocumentCode
2837017
Title
Impact of lithographic irregularity across mm-scale photonic-crystal notch filters
Author
Talneau, A. ; Lemarchand, F. ; Fehrembach, A.-L. ; Sentenac, A.
Author_Institution
Lab. de Photonique et de Nanostruct., CNRS, Marcoussis, France
fYear
2009
fDate
14-19 June 2009
Firstpage
1
Lastpage
1
Abstract
We investigate the impact of electronic lithography writing conditions on the performances of two-dimensional grating notch filters fabricated on SiO2/Ta2O5 stack. Field stitching errors as well as electron beam writing step are considered.
Keywords
diffraction gratings; electron beam lithography; optical fabrication; optical filters; photonic crystals; silicon compounds; tantalum compounds; SiO2-Ta2O5; electron beam writing step; electronic lithographic irregularity; field stitching errors; photonic-crystal notch filters; two-dimensional grating notch filter fabrication; Calibration; Electron beams; Gratings; Lithography; Nanopatterning; Nanostructures; Optical filters; Optical reflection; Resonance; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location
Munich
Print_ISBN
978-1-4244-4079-5
Electronic_ISBN
978-1-4244-4080-1
Type
conf
DOI
10.1109/CLEOE-EQEC.2009.5194810
Filename
5194810
Link To Document