Title :
A Low Cost Sensing Technique For Detecting Defects On Metal Sheets
Author :
Chen, Haitian ; Madawala, Udaya K. ; Tham, Jonathan
Author_Institution :
Auckland Univ., Auckland
Abstract :
This paper presents a simple yet effective technique for detecting defects on metal sheets that are used for making outer bowls of washing machines. The proposed technique uses two arrays of strategically aligned infra-red diodes (IRD) and photo-diodes (PD) to detect the defects on metal sheets through the use of variation of emissivity of reflective surfaces. The sensor system, consisting two arrays of optical diodes, is mounted on top of a conveyer belt that carries the metal sheets to identify the defects that exist on metal sheets as they pass under the sensor. A prototype system with twenty optical diodes per array is built and a microprocessor based controller is used to detect the defected sheets and to signal the operator with their origin of location. The proposed system is simple and suitable for industrial use as experimental results suggest that it can identify defects that are moving faster than 1 m/s and as small as 2 mm times 1 mm.
Keywords :
belts; conveyors; flaw detection; infrared detectors; photodiodes; prototypes; sheet materials; washing machines; conveyor belt; defect detection; infrared diodes; low cost sensing technique; metal sheets; optical diodes; photodiodes; prototype system; sensor system; washing machines; Belts; Costs; Diodes; Infrared detectors; Optical arrays; Optical sensors; Prototypes; Sensor arrays; Sensor systems; Washing machines; emissivity; infrared; optical diodes; sensors;
Conference_Titel :
Industrial Technology, 2006. ICIT 2006. IEEE International Conference on
Conference_Location :
Mumbai
Print_ISBN :
1-4244-0726-5
Electronic_ISBN :
1-4244-0726-5
DOI :
10.1109/ICIT.2006.372559