DocumentCode
2837346
Title
Digital scintillation-based dosimeter-on-a-chip
Author
Stapels, Christopher ; Johnson, Erik ; Sia, Radia ; Barton, Paul ; Wehe, David ; Squillante, Michael ; Christian, James
Author_Institution
Radiat. Monitoring Devices, Watertown
Volume
3
fYear
2007
fDate
Oct. 26 2007-Nov. 3 2007
Firstpage
1976
Lastpage
1981
Abstract
A reliable, low-cost, real-time dosimeter is constructed from a scintillation crystal mounted to a CMOS solid-state photomultiplier. Determination of the minimum silicon area that can provide reliable dose information is important to minimize dosimeter cost, and allow pervasive deployment. The purpose of this paper is to examine the effect of errors from event statistics and temperature variations on the dose measured in the crystal and the calculated human equivalent dose calculated using principal component analysis (PCA). Measured spectra are written as a linear combination of the calibration data sets, or principal components, and weighting factors from the calibration data are used to calculate the human equivalent dose. Applying this method to data measured by a 1.2times1.2times 0.2-mm3 LYSO scintillator coupled to a 100-pixel SSPM allows a predicted dose sensitivity better than 1 muSv, with far less than 40% error in determination of the dose from several unknown sources outside the calibration set. The measured sensitivity is approximately 1/300 the radiation dose from natural background in one month, making possible use as a potential replacement for a monthly film badge. Statistical fluctuations, temperature-induced gain fluctuations, and number of calibration sources required are investigated with respect to the dose calculated using the PCA method.
Keywords
CMOS digital integrated circuits; dosimetry; fluctuations; nuclear electronics; photomultipliers; principal component analysis; solid scintillation detectors; 100-pixel SSPM; CMOS solid-state photomultiplier; LYSO scintillator crystal; PCA method; principal component analysis; radiation dose; real-time dosimeter; statistical fluctuations; temperature-induced gain fluctuations; Calibration; Costs; Error analysis; Fluctuations; Humans; Photomultipliers; Principal component analysis; Silicon; Solid state circuits; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Conference_Location
Honolulu, HI
ISSN
1095-7863
Print_ISBN
978-1-4244-0922-8
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2007.4436541
Filename
4436541
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