Title :
Engineering machine diagnostic knowledge
Author :
Fung, Francis Cheong Yiu
Author_Institution :
French-Singapore Inst., Singapore
Abstract :
A description is presented of a joint project to develop a machine diagnostic expert system, called high vacuum evaporator diagnostics (XBAK). It is used for problem diagnosis in sophisticated manufacturing equipment used in microchip fabrication. A discussion is presented of a human diagnostician´s behavior observed during the knowledge acquisition sessions, and the behavioral attributes that have been built into XBAK based on these observations. Finally, an assessment is made of the success of XBAK, and the two major limitations suffered by most current expert systems are identified
Keywords :
electronic engineering computing; electronic equipment testing; expert systems; knowledge acquisition; maintenance engineering; XBAK; behavioral attributes; engineering machine diagnostic knowledge; high vacuum evaporator diagnostics; knowledge acquisition; machine diagnostic expert system; manufacturing equipment; microchip fabrication; problem diagnosis; Assembly; Diagnostic expert systems; Electric breakdown; Expert systems; Fabrication; Humans; Knowledge engineering; Maintenance engineering; Problem-solving; Production;
Conference_Titel :
TENCON '89. Fourth IEEE Region 10 International Conference
Conference_Location :
Bombay
DOI :
10.1109/TENCON.1989.177024
